Micro-Focus X-Ray Systems for Crystalline Lattice Strain and Inclusions
High-resolution radiographic techniques for non-destructive volume examination.
Focal Spot Geometry & Spatial Resolution
In conventional radiography, large focal spots produce severe geometric penumbra, blurring micro-inclusions below 50 microns. By implementing magnetically focused electron beam targets, micro-focus sources achieve spot sizes below 5 micrometers.
This enables geometric magnification factors exceeding 100x without loss of contrast, making it possible to resolve metallic solvent catalyst droplets embedded during synthetic diamond crystallization.
Diffraction Topography & Strain Mapping
Beyond simple shadowgraph absorption, monochromatic micro-focus X-ray beams probe lattice plane orientation through Bragg diffraction. Regions with high dislocation density or mechanical shear exhibit significant diffraction contrast variations.
Sub-5-micron focal spot geometry reveals micro-voids and solvent flux traces invisible to conventional 2D optical microscopy.
Key Scientific Takeaways
- Micro-focus sources eliminate penumbra blurring for sub-50-micron internal defects.
- X-ray topometry maps stress concentrations induced by rapid laboratory growth cycles.
- Provides definitive structural proof complementing optical spectroscopic fingerprints.